CONTAC

CONTAC

Exhibitor

Advanced analytics for the PI System


SCAN, unlimited potential for adding value

SCAN unites PI Data with the powerful AI&ML available technologies. Data Scientists interacts with PI Data using the familiar Notebook UI/UX paradigm; looking for patterns, cause-effect relationships and explanations for process and asset behaviors; also for developing application algorithms for predictors and early fault alerts. Algorithms can be automated, sending data back to the PI System.

Using SCAN tools, Data Scientist discoveries can be transformed into application libraries. SMEs can use the libraries from SCAN EXPLORER; a “no code” Notebook for end users.

SCAN direct interaction with PI data makes everything simple, no need for a complicated IT project, no need to move the PI data to the cloud or external data bases. SCAN openness free the user to select the best AI&ML technologies and use it from a familiar UX/UI.

SCAN covers all the actionable insights development cycle, from discovery to action; from specialized Data Scientists to SME´s and operators.


SEP Reliability Analytics

From asset delays, reason codes and operational information, SEP Analytics provide actionable information for reliability improvement.

Analysis and reporting is based on a tridimensional asset model: Asset Classes, Asset class specific Time Model and System Configuration (series, parallel, stand-by, redundant). A collection of industry standard KPIs and a configuration module can be applied to user selectable views of the 3D Asset Model.

Close integration with PI/AF-EF provides a 4th Dimension, the Asset health information related to its failure.

Customizable reports and an Excel Add-in provide the specific information needed by the different stakeholders. External reporting tools like MS-Reporting Services or MS-PBI can be used, getting data from SEP Data Warehouse.